Accession Number : ADP008675
Title : The Reliability of Optical Logic,
Corporate Author : CALIFORNIA INST OF TECH PASADENA
Personal Author(s) : Stirk, Charles W. ; Psaltis, Demetri
Report Date : 22 MAY 1992
Pagination or Media Count : 4
Abstract : One of the potential niches for optical logic is very high speed digital circuits. Conventional lithographic manufacturing techniques decrease the individual logic device cost when the device density per unit area increases. Thermal power dissipation limitations, however, restrict the device density at a given duty cycle and switching speed. Thus, we desire optical logic devices with small switching energies for high speed systems. Since switching energy usually decreases with decreasing device area, small devices decrease thermal dissipation problems and increase manufacturing density. On the other hand, small switching energy has some significant drawbacks. The main drawback is that since the number of photons required to switch the device is quite small, statistical fluctuations in the detected number of photons can make the device switch when it is not supposed to, or not switch when it is. The focus of this paper is to analyze the effect of the contrast ratio and fan-in of quantum noise limited optical logic devices on the reliability of their circuits as measured by the bit error rate.
Descriptors : *OPTICAL CIRCUITS, *RELIABILITY(ELECTRONICS), PHOTONS, HIGH VELOCITY, INPUT OUTPUT DEVICES.
Subject Categories : Electrooptical and Optoelectronic Devices
Distribution Statement : APPROVED FOR PUBLIC RELEASE