Accession Number : ADP008946
Title : Application of a Semiconductor-LDA for Inflight Measurements,
Corporate Author : ERLANGEN-NUERNBERG UNIV (GERMANY F R) LEHRSTUHL FUER STROEMUNGSMECHANIK
Personal Author(s) : Durst, F. ; Lienhart, H. ; Mueller, R.
Report Date : 23 JUL 1992
Pagination or Media Count : 4
Abstract : Motivated by the need of new measuring techniques for the development of a new generation of transport aircraft incorporating a laminar wing, and LDA system for inflight measurements was developed at LSTM Erlangen. The paper reports the design and construction of the LDA and discusses alternatives to the present design. To verify the performance of the instrument, boundary layer measurements in a wind tunnel and first free flight investigations are presented. Conclusions are drawn considering further improvements of the LDA and the requirements imposed on the aircraft. The incorporation of these will ensure the application of LDA in modern aerodynamic research for laboratory and inflight studies. (Author)
Descriptors : *LASER ANEMOMETERS, *LAMINAR BOUNDARY LAYER, *WINGS, INFLIGHT, EXPERIMENTAL DESIGN, DATA ACQUISITION, OPTICAL DETECTORS, TRANSPORT AIRCRAFT, GERMANY.
Subject Categories : Optical Detection and Detectors
Radiation and Nuclear Chemistry
Distribution Statement : APPROVED FOR PUBLIC RELEASE