Accession Number : ADP010167

Title :   Subsurface Defect Detection in Ceramic Materials Using Low Coherence Optical Scatter Reflectometer

Corporate Author : NAVAL RESEARCH LAB WASHINGTON DC

Personal Author(s) : Bashkansky, Mark ; Duncan, Michael D. ; Kahn, Manfred ; Lewis, David, III ; Reintjes, J. F.

PDF Url : ADP010167

Report Date : APR 1996

Pagination or Media Count : 9

Abstract : We demonstrate the use of optical gating techniques for determining the size and location of subsurface defects in advanced ceramic materials. Various silicon nitride based ceramic materials are probed non-destructively using an optical gated reflectometer based on a low-coherence fiber interferometer. This device is capable of depth and lateral resolutions of 10 micrometers and 4 micrometers, respectively. Experimental results indicate that the size and position of small subsurface defects can be determined as deep as 500 micrometers below the surface.

Descriptors :   *SYMPOSIA, *CERAMIC MATERIALS, *REFLECTOMETERS, NONDESTRUCTIVE TESTING, GRATINGS(SPECTRA), DEFECTS(MATERIALS).

Subject Categories : Ceramics, Refractories and Glass
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE